Coherence and sampling requirements for diffractive imaging

Ultramicroscopy

Volumn 101, Issue 2-4, 2004, Pages 149-152

  Spence, J C H ^a   Weierstall, U ^a   Howells, M ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

42.30.Rz; 42.30.Wb; 61.10.Nz; 68.37.Yz; Coherence; Diffraction imaging; Phase problems; Sampling theorem

Indexed keywords

CAMERAS; COHERENT LIGHT; CRYSTALS; IMAGE RECONSTRUCTION; NANOSTRUCTURED MATERIALS; PROBLEM SOLVING; PROTEINS;

BRAGG SCATTERING; COHERENCE DIFFRACTIVE IMAGING (CDI); DIFFRACTION PATTERNS; ISOLATED NANOSTRUCTURES;

IMAGING TECHNIQUES;

PROTEIN;

ARTICLE; CAMERA; CORRELATION ANALYSIS; CRYSTAL; CRYSTALLOGRAPHY; DIFFRACTION; ENERGY; IMAGING; ISOLATION PROCEDURE; SAMPLING; X RAY DIFFRACTION;

MODELS, THEORETICAL; NANOTECHNOLOGY; OPTICS; SCATTERING, RADIATION; X-RAY DIFFRACTION;

EID: 4644219996     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.05.005     Document Type: Article

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