Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon

Journal of Physics Condensed Matter

Volumn 19, Issue 45, 2007, Pages

  Bogle, Stephanie N ^a   Voyles, Paul M ^b   Khare, Sanjay V ^a,c   Abelson, John R ^b,d  

^a University of Illinois at Urbana Champaign   (United States)

^b University of Wisconsin Madison   (United States)

^c UNIVERSITY OF TOLEDO   (United States)

^d UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; CORRELATION METHODS; CRYSTALLINE MATERIALS; DISTRIBUTION FUNCTIONS; ELECTRON MICROSCOPY;

AMORPHOUS MATRIX; COMPLEX FUNCTION; FLUCTUATION ELECTRON MICROSCOPY (FEM); RADIAL DISTRIBUTION FUNCTION;

AMORPHOUS SILICON;

EID: 36048940114     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/45/455204     Document Type: Conference Paper

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