Surface and grain-boundary scattering in nanometric Cu films

Physical Review B - Condensed Matter and Materials Physics

Volumn 81, Issue 15, 2010, Pages

  Sun, Tik ^a   Yao, Bo ^a   Warren, Andrew P ^a   Barmak, Katayun ^b   Toney, Michael F ^c   Peale, Robert E ^a   Coffey, Kevin R ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77955360675     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.155454     Document Type: Article

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35. The values shown in Table differ in detail from similar tables in references 3 and 21 due to the inclusion of additional grain size and x-ray reflectivity data. These changes resulted in minimal quantitative changes to the optimized model parameters calculated. For example, Ref. reports a MS reflection coefficient of 0.50 ± 0.03 to describe room temperature resistivity data and this may be compared to the room temperature MST model value of 0.49 given in the current work. Similarly, Ref. reports a low temperature MS reflection coefficient of 0.44 and this can be compared to the low temperature MST model value of 0.43 given in the current work.