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Volumn 66, Issue 7, 2002, Pages 754141-754144

Size-dependent resistivity of metallic wires in the mesoscopic range

Author keywords

[No Author keywords available]

Indexed keywords

COPPER;

EID: 0037104274     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.075414     Document Type: Article
Times cited : (477)

References (14)
  • 8
    • 0034431455 scopus 로고    scopus 로고
    • Materials, Technology, and Reliability for Advanced Interconnects and Lou-k Dielectrics, edited by K. Maex et al., (Materials Research Society, Warrendale, PA)
    • T. Kuan, C.K. Inoki, G.S. Oehrlein, K. Rose, Y.-P. Zhao, G.-C. Wang, S.M. Rossnagel, and C. Cabral, in Materials, Technology, and Reliability for Advanced Interconnects and Lou-k Dielectrics, edited by K. Maex et al., Mater. Res. Soc. Symp. Proc. 612 (Materials Research Society, Warrendale, PA, 2000), p. D7.1.1.
    • (2000) Mater. Res. Soc. Symp. Proc. , vol.612
    • Kuan, T.1    Inoki, C.K.2    Oehrlein, G.S.3    Rose, K.4    Zhao, Y.-P.5    Wang, G.-C.6    Rossnagel, S.M.7    Cabral, C.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.