A methodology for automated quantitative microstructural analysis of transmission electron micrographs

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 5843-5854

  Carpenter, D T ^a   Rickman, J M ^a   Barmak, K ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000259668     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368898     Document Type: Article

References (20)

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