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Volumn 99, Issue 12, 2006, Pages
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The effect of surface roughness on the resistivity increase in nanometric dimensions
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY;
ELECTRON SCATTERING;
ETCHING;
GRAIN BOUNDARIES;
METALLIC FILMS;
SURFACE PHENOMENA;
SURFACE ROUGHNESS;
THIN FILMS;
CONDUCTION ELECTRON;
COPPER FILM;
DE BROGLIE WAVELENGTH;
NANOMETRIC DIMENSION;
NANOSTRUCTURED MATERIALS;
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EID: 33745683332
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2204349 Document Type: Article |
Times cited : (72)
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References (12)
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