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Volumn 99, Issue 12, 2006, Pages

The effect of surface roughness on the resistivity increase in nanometric dimensions

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRON SCATTERING; ETCHING; GRAIN BOUNDARIES; METALLIC FILMS; SURFACE PHENOMENA; SURFACE ROUGHNESS; THIN FILMS;

EID: 33745683332     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2204349     Document Type: Article
Times cited : (72)

References (12)
  • 12
    • 33745687140 scopus 로고    scopus 로고
    • H. Marom and M. Eizenberg (unpublished)
    • H. Marom and M. Eizenberg (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.