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Volumn 10, Issue 4, 2010, Pages 2547-2551

Role of trimethylboron to silane ratio on the properties of p-type nanocrystalline silicon thin film deposited by radio frequency plasma enhanced chemical vapour deposition

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION PRESSURES; DIBORANE; ELECTRICAL MEASUREMENT; GAS SOURCES; GROWTH MECHANISMS; HYDROGEN DILUTION; HYDROGENATED NANOCRYSTALLINE SILICON CARBIDE; NANO-CRYSTALLINE SILICON THIN FILMS; P-TYPE; P-TYPE SILICON; PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION; RADIO FREQUENCY PLASMA; RF-PECVD; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSURFACE LAYER; TRIMETHYLBORON;

EID: 77954980837     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2010.1434     Document Type: Conference Paper
Times cited : (4)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.