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Volumn 10, Issue 4, 2010, Pages 2547-2551
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Role of trimethylboron to silane ratio on the properties of p-type nanocrystalline silicon thin film deposited by radio frequency plasma enhanced chemical vapour deposition
a,b a b a a,b |
Author keywords
[No Author keywords available]
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Indexed keywords
DEPOSITION PRESSURES;
DIBORANE;
ELECTRICAL MEASUREMENT;
GAS SOURCES;
GROWTH MECHANISMS;
HYDROGEN DILUTION;
HYDROGENATED NANOCRYSTALLINE SILICON CARBIDE;
NANO-CRYSTALLINE SILICON THIN FILMS;
P-TYPE;
P-TYPE SILICON;
PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION;
RADIO FREQUENCY PLASMA;
RF-PECVD;
STRUCTURAL AND ELECTRICAL PROPERTIES;
SUBSURFACE LAYER;
TRIMETHYLBORON;
DEPOSITION;
ELECTRIC PROPERTIES;
METHANE;
OPTICAL PROPERTIES;
OPTOELECTRONIC DEVICES;
PLASMA DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON CARBIDE;
SPECTROSCOPIC ELLIPSOMETRY;
NANOCRYSTALLINE SILICON;
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EID: 77954980837
PISSN: 15334880
EISSN: None
Source Type: Journal
DOI: 10.1166/jnn.2010.1434 Document Type: Conference Paper |
Times cited : (4)
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References (22)
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