Low-power soft error hardened latch

Journal of Low Power Electronics

Volumn 6, Issue 1, 2010, Pages 218-226

  Alidash, Hossein Karimiyan ^a   Oklobdzija, Vojin G ^b  

^a ISFAHAN UNIVERSITY OF TECHNOLOGY   (Iran)

^b UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

Alpha particles; Atmospheric neutrons; Design for reliability; Design for soft error mitigation; Fault tolerant design; Hardened latch; Reliability; Single Event transients; Single Event upsets; Soft errors; Static latch

Indexed keywords

ALPHA PARTICLES; COMPUTER CIRCUITS; ERROR CORRECTION; HARDENING; LOGIC CIRCUITS; RADIATION HARDENING; RELIABILITY; SPICE; TRANSIENTS; TRIGGER CIRCUITS;

ATMOSPHERIC NEUTRONS; DESIGN FOR RELIABILITY; FAULT TOLERANT DESIGN; HARDENED LATCH; SINGLE EVENT TRANSIENTS; SINGLE EVENT UPSETS; SOFT ERROR; SOFT ERROR MITIGATIONS; STATIC LATCH;

LOW POWER ELECTRONICS;

EID: 77954944905     PISSN: 15461998     EISSN: 15462005     Source Type: Journal    
DOI: 10.1166/jolpe.2010.1073     Document Type: Conference Paper

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