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Volumn 107, Issue 12, 2010, Pages

The effect of rare-earth clustering on charge trapping and electroluminescence in rare-earth implanted metal-oxide-semiconductor light-emitting devices

Author keywords

[No Author keywords available]

Indexed keywords

CAPTURE CROSS SECTIONS; CHARGED DEFECTS; CLUSTER SIZES; CONCENTRATION OF; COULOMB REPULSIONS; DIELECTRIC MEDIA; ENHANCED SCATTERING; EXCITATION CROSS SECTION; FURNACE ANNEALING; LIGHT EMITTING DEVICES; MATRIX; METAL OXIDE SEMICONDUCTOR; OXYGEN DEFICIENCY; POSITIVE CHARGES; QUENCHING PROCESS; SHELL MODELS; SMALL SIZE; TUNNELING DISTANCE;

EID: 77954212257     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3436591     Document Type: Article
Times cited : (39)

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