-
1
-
-
0037373476
-
-
PELNFM 1386-9477. 10.1016/S1386-9477(02)00644-6
-
M. E. Castagna, S. Coffa, M. Monaco, L. Caristia, A. Messina, R. Mangano, and C. Bongiorno, Physica E (Amsterdam) PELNFM 1386-9477 16, 547 (2003). 10.1016/S1386-9477(02)00644-6
-
(2003)
Physica e (Amsterdam)
, vol.16
, pp. 547
-
-
Castagna, M.E.1
Coffa, S.2
Monaco, M.3
Caristia, L.4
Messina, A.5
Mangano, R.6
Bongiorno, C.7
-
2
-
-
1042288897
-
-
NIMBEU 0168-583X. 10.1016/j.nimb.2003.11.038
-
A. Irrera, M. Miritello, D. Pacifici, G. Franzo, F. Priolo, F. Iacona, D. Sanfilippo, G. Di Stefano, and P. G. Fallica, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 216, 222 (2004). 10.1016/j.nimb.2003.11.038
-
(2004)
Nucl. Instrum. Methods Phys. Res. B
, vol.216
, pp. 222
-
-
Irrera, A.1
Miritello, M.2
Pacifici, D.3
Franzo, G.4
Priolo, F.5
Iacona, F.6
Sanfilippo, D.7
Di Stefano, G.8
Fallica, P.G.9
-
3
-
-
0035942377
-
Efficient electroluminescence from rare earth doped MOS diodes
-
DOI 10.1016/S0921-5107(00)00668-1, PII S0921510700006681
-
S. Wang, S. Coffa, R. Carius, and Ch. Buchal, Mater. Sci. Eng., B MSBTEK 0921-5107 81, 102 (2001). 10.1016/S0921-5107(00)00668-1 (Pubitemid 32288081)
-
(2001)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
, vol.81
, Issue.1-3
, pp. 102-104
-
-
Wang, S.1
Coffa, S.2
Carius, R.3
Buchal, Ch.4
-
4
-
-
4243080144
-
-
ZDACE2 0178-7683. 10.1007/BF01437456
-
C. Bŕchignac, Ph. Cahuzac, F. Carlier, and J. Ph. Roux, Z. Phys. D: At., Mol. Clusters ZDACE2 0178-7683 28, 67 (1993). 10.1007/BF01437456
-
(1993)
Z. Phys. D: At., Mol. Clusters
, vol.28
, pp. 67
-
-
Bŕchignac, C.1
Cahuzac, Ph.2
Carlier, F.3
Roux, J.Ph.4
-
5
-
-
21644460284
-
3+ in silicon metal-oxide-semiconductor devices
-
DOI 10.1063/1.1935766, 123513
-
J. M. Sun, W. Skorupa, T. Dekorsy, M. Helm, L. Rebohle, and T. Gebel, J. Appl. Phys. JAPIAU 0021-8979 97, 123513 (2005). 10.1063/1.1935766 (Pubitemid 40925301)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.12
, pp. 1-7
-
-
Sun, J.M.1
Skorupa, W.2
Dekorsy, T.3
Helm, M.4
Rebohle, L.5
Gebel, T.6
-
6
-
-
34247894038
-
Switchable two-color electroluminescence based on a Si metal-oxide- semiconductor structure doped with Eu
-
DOI 10.1063/1.2735285
-
S. Prucnal, J. M. Sun, W. Skorupa, and M. Helm, Appl. Phys. Lett. APPLAB 0003-6951 90, 181121 (2007). 10.1063/1.2735285 (Pubitemid 46701119)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.18
, pp. 181121
-
-
Prucnal, S.1
Sun, J.M.2
Skorupa, W.3
Helm, M.4
-
7
-
-
33744822500
-
2 gate oxide layers
-
DOI 10.1063/1.2197247
-
J. M. Sun, S. Pruchnal, W. Skorupa, T. Dekorsy, A. Muchlich, M. Helm, L. Rebohle, and T. Gebel, J. Appl. Phys. JAPIAU 0021-8979 99, 103102 (2006). 10.1063/1.2197247 (Pubitemid 43838514)
-
(2006)
Journal of Applied Physics
, vol.99
, Issue.10
, pp. 103102
-
-
Sun, J.M.1
Prucnal, S.2
Skorupa, W.3
Dekorsy, T.4
Muchlich, A.5
Helm, M.6
Rebohle, L.7
Gebel, T.8
-
8
-
-
0017532558
-
2
-
DOI 10.1063/1.324253
-
P. Solomon, J. Appl. Phys. JAPIAU 0021-8979 48, 3843 (1977). 10.1063/1.324253 (Pubitemid 8550840)
-
(1977)
Journal of Applied Physics
, vol.48
, Issue.9
, pp. 3843-3849
-
-
Solomon, P.1
-
10
-
-
0142025616
-
-
JAPIAU 0021-8979. 10.1063/1.1604934
-
A. Nazarov, T. Gebel, L. Rebohle, W. Skorupa, I. Osiyuk, and V. Lysenko, J. Appl. Phys. JAPIAU 0021-8979 94, 4440 (2003). 10.1063/1.1604934
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 4440
-
-
Nazarov, A.1
Gebel, T.2
Rebohle, L.3
Skorupa, W.4
Osiyuk, I.5
Lysenko, V.6
-
12
-
-
33646910215
-
-
edited by G. Adachi, N. Imanaka, and Z. C. Kang (Kluwer Academic, Dordrecht, Boston, London)
-
L. R. Morss and R. J. M. Konings, in Binary Rare Earth Oxides, edited by, G. Adachi, N. Imanaka, and, Z. C. Kang, (Kluwer Academic, Dordrecht, Boston, London, 2004), p. 163.
-
(2004)
Binary Rare Earth Oxides
, pp. 163
-
-
Morss, L.R.1
Konings, R.J.M.2
-
13
-
-
73849092406
-
-
JAPIAU 0021-8979. 10.1063/1.3272781
-
L. Rebohle, J. Lehmann, S. Prucnal, A. Nazarov, I. Tyagulskii, S. Tyagulskii, A. Kanjilal, M. Voelskow, D. Grambole, W. Skorupa, and M. Helm, J. Appl. Phys. JAPIAU 0021-8979 106, 123103 (2009). 10.1063/1.3272781
-
(2009)
J. Appl. Phys.
, vol.106
, pp. 123103
-
-
Rebohle, L.1
Lehmann, J.2
Prucnal, S.3
Nazarov, A.4
Tyagulskii, I.5
Tyagulskii, S.6
Kanjilal, A.7
Voelskow, M.8
Grambole, D.9
Skorupa, W.10
Helm, M.11
-
14
-
-
0001365396
-
-
JAPIAU 0021-8979. 10.1063/1.368591
-
H. Amekura, A. Eckau, R. Carius, and Ch. Buchal, J. Appl. Phys. JAPIAU 0021-8979 84, 3867 (1998). 10.1063/1.368591
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 3867
-
-
Amekura, H.1
Eckau, A.2
Carius, R.3
Buchal, Ch.4
-
16
-
-
0035881794
-
-
THSFAP 0040-6090. 10.1016/S0040-6090(01)01153-1
-
S. A. Studenikin and M. Cocivera, Thin Solid Films THSFAP 0040-6090 394, 264 (2001). 10.1016/S0040-6090(01)01153-1
-
(2001)
Thin Solid Films
, vol.394
, pp. 264
-
-
Studenikin, S.A.1
Cocivera, M.2
-
17
-
-
0001663659
-
-
JAPIAU 0021-8979. 10.1063/1.363223
-
H. Nishikawa, E. Watanabe, D. Ito, Y. Sakurai, K. Nagasawa, and Y. Ohki, J. Appl. Phys. JAPIAU 0021-8979 80, 3513 (1996). 10.1063/1.363223
-
(1996)
J. Appl. Phys.
, vol.80
, pp. 3513
-
-
Nishikawa, H.1
Watanabe, E.2
Ito, D.3
Sakurai, Y.4
Nagasawa, K.5
Ohki, Y.6
-
18
-
-
67349243628
-
-
MIENEF 0167-9317. 10.1016/j.mee.2009.03.034
-
S. Tyagulskiy, I. Tyagulskyy, A. Nazarov, V. Lysenko, L. Rebohle, J. Lehmann, and W. Skorupa, Microelectron. Eng. MIENEF 0167-9317 86, 1954 (2009). 10.1016/j.mee.2009.03.034
-
(2009)
Microelectron. Eng.
, vol.86
, pp. 1954
-
-
Tyagulskiy, S.1
Tyagulskyy, I.2
Nazarov, A.3
Lysenko, V.4
Rebohle, L.5
Lehmann, J.6
Skorupa, W.7
-
19
-
-
0001638611
-
-
PRLTAO 0031-9007. 10.1103/PhysRevLett.62.1388
-
R. Tohmon, Y. Shimogaichi, H. Mizuno, Y. Okhi, K. Nagasawa, and Y. Hama, Phys. Rev. Lett. PRLTAO 0031-9007 62, 1388 (1989). 10.1103/PhysRevLett.62.1388
-
(1989)
Phys. Rev. Lett.
, vol.62
, pp. 1388
-
-
Tohmon, R.1
Shimogaichi, Y.2
Mizuno, H.3
Okhi, Y.4
Nagasawa, K.5
Hama, Y.6
-
20
-
-
34547304799
-
2 layers
-
DOI 10.1007/s00340-007-2700-0
-
S. Prucnal, J. M. Sun, A. Nazarov, I. P. Tyagulskii, I. N. Osiyuk, R. Fedaruk, and W. Skorupa, Appl. Phys. B APDOEM 0946-2171 88, 241 (2007). 10.1007/s00340-007-2700-0 (Pubitemid 47130451)
-
(2007)
Applied Physics B: Lasers and Optics
, vol.88
, Issue.2
, pp. 241-244
-
-
Prucnal, S.1
Sun, J.M.2
Nazarov, A.3
Tjagulskii, I.P.4
Osiyuk, I.N.5
Fedaruk, R.6
Skorupa, W.7
-
21
-
-
27944438949
-
Erbium in silicon
-
DOI 10.1088/0268-1242/20/12/R02, PII S0268124205766396
-
A. J. Kenyon, Semicond. Sci. Technol. SSTEET 0268-1242 20, R65 (2005). 10.1088/0268-1242/20/12/R02 (Pubitemid 41662325)
-
(2005)
Semiconductor Science and Technology
, vol.20
, Issue.12
-
-
Kenyon, A.J.1
-
22
-
-
0020767101
-
-
PSSABA 0031-8965. 10.1002/pssa.2210770236
-
R. N. Litovskii, V. S. Lysenko, A. N. Nazarov, T. E. Rudenko, S. B. Kaschieva, and N. R. Nedev, Phys. Status Solidi A PSSABA 0031-8965 77, 699 (1983). 10.1002/pssa.2210770236
-
(1983)
Phys. Status Solidi A
, vol.77
, pp. 699
-
-
Litovskii, R.N.1
Lysenko, V.S.2
Nazarov, A.N.3
Rudenko, T.E.4
Kaschieva, S.B.5
Nedev, N.R.6
-
23
-
-
0021392247
-
Study of the atomic models of three donorlike defects in silicon metal-oxide-semiconductor structures from their gate material and process dependencies
-
DOI 10.1063/1.333411
-
C. T. Sah, J. Y.-C. Sun, and J. J.-T. Tzou, J. Appl. Phys. JAPIAU 0021-8979 55, 1525 (1984). 10.1063/1.333411 (Pubitemid 14588868)
-
(1984)
Journal of Applied Physics
, vol.55
, Issue.6 PART 1
, pp. 1525-1545
-
-
Sah, C.T.1
Sun, J.Y.-C.2
Tzou, J.J.-T.3
-
25
-
-
0000675006
-
-
JAPIAU 0021-8979. 10.1063/1.335223
-
M. V. Fischetti, J. Appl. Phys. JAPIAU 0021-8979 57, 2860 (1985). 10.1063/1.335223
-
(1985)
J. Appl. Phys.
, vol.57
, pp. 2860
-
-
Fischetti, M.V.1
-
27
-
-
21544467967
-
-
JAPIAU 0021-8979. 10.1063/1.342824
-
D. J. DiMaria and J. W. Stasiak, J. Appl. Phys. JAPIAU 0021-8979 65, 2342 (1989). 10.1063/1.342824
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2342
-
-
Dimaria, D.J.1
Stasiak, J.W.2
-
29
-
-
0001323947
-
-
JAPIAU 0021-8979. 10.1063/1.352074
-
S. E. Thompson and T. Nishida, J. Appl. Phys. JAPIAU 0021-8979 72, 4683 (1992). 10.1063/1.352074
-
(1992)
J. Appl. Phys.
, vol.72
, pp. 4683
-
-
Thompson, S.E.1
Nishida, T.2
-
31
-
-
0019612331
-
2 films
-
DOI 10.1063/1.329502
-
F. J. Feigl, D. R. Young, D. J. DiMaria, S. Lai, and J. Calise, J. Appl. Phys. JAPIAU 0021-8979 52, 5665 (1981). 10.1063/1.329502 (Pubitemid 12439821)
-
(1981)
Journal of Applied Physics
, vol.52
, Issue.9
, pp. 5665-5682
-
-
Feigl, F.J.1
Young, D.R.2
DiMaria, D.J.3
Lai, S.4
Calise, J.5
-
32
-
-
0013285486
-
-
JAPIAU 0021-8979. 10.1063/1.353065
-
D. Vuillaume and A. Bravaix, J. Appl. Phys. JAPIAU 0021-8979 73, 2559 (1993). 10.1063/1.353065
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 2559
-
-
Vuillaume, D.1
Bravaix, A.2
-
33
-
-
0037381456
-
-
MCRLAS 0026-2714. 10.1016/S0026-2714(03)00030-1
-
V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, H. Wong, G. M. Zhidomirov, and M. Roger, Microelectron. Reliab. MCRLAS 0026-2714 43, 665 (2003). 10.1016/S0026-2714(03)00030-1
-
(2003)
Microelectron. Reliab.
, vol.43
, pp. 665
-
-
Gritsenko, V.A.1
Shaposhnikov, A.V.2
Novikov, Yu.N.3
Baraban, A.P.4
Wong, H.5
Zhidomirov, G.M.6
Roger, M.7
-
35
-
-
0015207089
-
-
JAPIAU 0021-8979. 10.1063/1.1659996
-
E. H. Nicollian, C. N. Berglund, P. F. Schmidt, and J. M. Andrews, J. Appl. Phys. JAPIAU 0021-8979 42, 5654 (1971). 10.1063/1.1659996
-
(1971)
J. Appl. Phys.
, vol.42
, pp. 5654
-
-
Nicollian, E.H.1
Berglund, C.N.2
Schmidt, P.F.3
Andrews, J.M.4
-
36
-
-
0035339636
-
-
JAPIAU 0021-8979. 10.1063/1.1363680
-
D. J. DiMaria and J. H. Stathis, J. Appl. Phys. JAPIAU 0021-8979 89, 5015 (2001). 10.1063/1.1363680
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 5015
-
-
Dimaria, D.J.1
Stathis, J.H.2
-
38
-
-
0344227232
-
-
JAPIAU 0021-8979. 10.1063/1.337264
-
D. J. DiMaria, M. V. Fischetti, M. Arienzo, and E. Tierney, J. Appl. Phys. JAPIAU 0021-8979 60, 1719 (1986). 10.1063/1.337264
-
(1986)
J. Appl. Phys.
, vol.60
, pp. 1719
-
-
Dimaria, D.J.1
Fischetti, M.V.2
Arienzo, M.3
Tierney, E.4
-
39
-
-
0000635723
-
-
PRBMDO 0163-1829. 10.1103/PhysRevB.49.10278
-
D. Arnold, E. Cartier, and D. J. DiMaria, Phys. Rev. B PRBMDO 0163-1829 49, 10278 (1994). 10.1103/PhysRevB.49.10278
-
(1994)
Phys. Rev. B
, vol.49
, pp. 10278
-
-
Arnold, D.1
Cartier, E.2
Dimaria, D.J.3
-
40
-
-
0041510248
-
-
JAPIAU 0021-8979. 10.1063/1.1589591
-
A. N. Nazarov, V. I. Kilchytska, Y. Houk, and D. Ballutaud, J. Appl. Phys. JAPIAU 0021-8979 94, 1823 (2003). 10.1063/1.1589591
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 1823
-
-
Nazarov, A.N.1
Kilchytska, V.I.2
Houk, Y.3
Ballutaud, D.4
-
42
-
-
36549092971
-
-
JAPIAU 0021-8979. 10.1063/1.344534
-
D. A. Buchanan and D. J. DiMaria, J. Appl. Phys. JAPIAU 0021-8979 67, 7439 (1990). 10.1063/1.344534
-
(1990)
J. Appl. Phys.
, vol.67
, pp. 7439
-
-
Buchanan, D.A.1
Dimaria, D.J.2
-
44
-
-
0023421875
-
2 films
-
DOI 10.1016/0038-1101(87)90130-4
-
A. Yankova, L. Do Thanh, and P. Balk, Solid-State Electron. SSELA5 0038-1101 30, 939 (1987). 10.1016/0038-1101(87)90130-4 (Pubitemid 17653561)
-
(1987)
Solid-State Electronics
, vol.30
, Issue.9
, pp. 939-946
-
-
Yankova, A.1
Thanh, L.D.2
Balk, P.3
-
45
-
-
0020749928
-
Generation-annealing kinetics of the interface donor states at 0. 25 ev above the midgap and the turn-around phenomena on oxidized silicon during avalanche electron injection
-
DOI 10.1063/1.332324
-
C. T. Sah, J. Y.-C. Sun, and J. J.-T. Tzou, J. Appl. Phys. JAPIAU 0021-8979 54, 2547 (1983). 10.1063/1.332324 (Pubitemid 13562976)
-
(1983)
Journal of Applied Physics
, vol.54
, Issue.5
, pp. 2547-2555
-
-
Sah, C.-T.1
Sun, J.Y.-C.2
Tzou, J.J.-T.3
-
46
-
-
33750416478
-
Charge trapping phenomena in high-efficiency metal-oxide-silicon light-emitting diodes with ion-implanted oxide
-
DOI 10.1016/j.jlumin.2006.07.014, PII S0022231306005321
-
A. Nazarov, I. Osiyuk, I. Tyagulskii, V. Lysenko, S. Prucnal, J. Sun, L. Rebohle, W. Skorupa, and R. Yankov, J. Lumin. JLUMA8 0022-2313 121, 213 (2006). 10.1016/j.jlumin.2006.07.014 (Pubitemid 44642311)
-
(2006)
Journal of Luminescence
, vol.121
, Issue.SPEC. ISS.
, pp. 213-216
-
-
Nazarov, A.1
Osiyuk, I.2
Tyagulskii, I.3
Lysenko, V.4
Prucnal, S.5
Sun, J.6
Skorupa, W.7
Yankov, R.A.8
-
47
-
-
43249086425
-
-
APDOEM 0946-2171. 10.1007/s00340-008-2948-z
-
S. Prucnal, L. Rebohle, A. N. Nazarov, I. Osiyuk, I. Tyagulskii, and W. Skorupa, Appl. Phys. B APDOEM 0946-2171 91, 123 (2008). 10.1007/s00340-008-2948- z
-
(2008)
Appl. Phys. B
, vol.91
, pp. 123
-
-
Prucnal, S.1
Rebohle, L.2
Nazarov, A.N.3
Osiyuk, I.4
Tyagulskii, I.5
Skorupa, W.6
-
48
-
-
0002546762
-
-
APDOEM 0946-2171. 10.1007/PL00006966
-
L. Rebohle, J. von Borany, H. Fröb, and W. Skorupa, Appl. Phys. B APDOEM 0946-2171 71, 131 (2000). 10.1007/PL00006966
-
(2000)
Appl. Phys. B
, vol.71
, pp. 131
-
-
Rebohle, L.1
Von Borany, J.2
Fröb, H.3
Skorupa, W.4
-
49
-
-
33947169382
-
Quenching of electroluminescence and charge trapping in high-efficiency Ge-implanted MOS light-emitting silicon diodes
-
DOI 10.1007/s00340-006-2534-1
-
A. N. Nazarov, I. N. Osiyuk, J. M. Sun, R. A. Yankov, W. Skorupa, I. P. Tyagulskii, V. S. Lysenko, S. Prucnal, T. Gebel, and L. Rebohle, Appl. Phys. B APDOEM 0946-2171 87, 129 (2007). 10.1007/s00340-006-2534-1 (Pubitemid 46407984)
-
(2007)
Applied Physics B: Lasers and Optics
, vol.87
, Issue.1
, pp. 129-134
-
-
Nazarov, A.N.1
Osiyuk, I.N.2
Sun, J.M.3
Yankov, R.A.4
Skorupa, W.5
Tyagulskii, I.P.6
Lysenko, V.S.7
Prucnal, S.8
Gebel, T.9
Rebohle, L.10
|