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Ultramicroscopy

Volumn 106, Issue 3, 2006, Pages 233-239

An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy method

(3) Nakanishi, Nobuto a Kotaka, Yasutoshi b Yamazaki, Takashi a

a TOKYO UNIVERSITY OF SCIENCE (Japan)

b FUJITSU LABORATORIES LTD (Japan)

Author keywords

Atomic resolution microscopy; Maximum entropy method; STEM

Indexed keywords

ENTROPY; IMAGE RECONSTRUCTION; LAGRANGE MULTIPLIERS; LOW PASS FILTERS; PARAMETER ESTIMATION; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC-RESOLUTION MICROSCOPY; MAXIMUM ENTROPY METHOD; STEM;

NOISE ABATEMENT;

ARTICLE; ENTROPY; FILTRATION; MICROSCOPE IMAGE; NOISE; NOISE REDUCTION; PARAMETER; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 29244439036 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2005.07.006 Document Type: Article

Times cited : (11)

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