Direct observation of single dopant atom in light-emitting phosphor of Β-SiAlON: Eu2+

Applied Physics Letters

Volumn 94, Issue 4, 2009, Pages

  Kimoto, Koji ^a,b   Xie, Rong Jun ^a   Matsui, Yoshio ^a   Ishizuka, Kazuo ^a,c   Hirosaki, Naoto ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Higashimatsuyama   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; CRYSTAL ATOMIC STRUCTURE; EUROPIUM; LIGHT EMISSION; LUMINESCENCE; NITRIDES; PHOSPHORS; RARE EARTH ELEMENTS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ADVANCED MATERIALS; ATOMIC CHANNELS; ATOMIC SITES; DARK-FIELD IMAGES; DIRECT OBSERVATIONS; DOPANT ATOMS; IMAGE CONTRASTS; LIGHT-EMITTING PHOSPHORS; RARE-EARTH DOPED; SCANNING TRANSMISSION ELECTRON MICROSCOPIES; SIMULATION RESULTS;

DOPING (ADDITIVES);

EID: 59349116920     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3076110     Document Type: Article

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