New class of tests for open faults with considering adjacent lines

Proceedings of the Asian Test Symposium

Volumn , Issue , 2009, Pages 301-306

  Takahashi, Hiroshi ^a   Higami, Yoshinobu ^a   Takamatsu, Yuzo ^a   Yamazaki, Koji ^b   Tsutsumi, Toshiyuki ^b   Yotsuyanagi, Hiroyuki ^c   Hashizume, Masaki ^c  

^a EHIME UNIVERSITY   (Japan)

^b MEIJI UNIVERSITY   (Japan)

^c UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

Adjacent lines; Open fault; Ordered pair of tests(OPT); Test pattern generation

Indexed keywords

CIRCUIT PARAMETER; DEEP SUB-MICRON; EXCITATION FUNCTION; FAULT COVERAGES; LAYOUT INFORMATION; OPEN FAULTS; STUCK-AT FAULTS; TEST PATTERN GENERATIONS; THRESHOLD FUNCTIONS;

ELECTRIC NETWORK PARAMETERS;

TESTING;

EID: 77951150874     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2009.39     Document Type: Conference Paper

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