Clues for modeling and diagnosing open faults with considering adjacent lines

Proceedings of the Asian Test Symposium

Volumn , Issue , 2007, Pages 39-44

  Takahashi, Hiroshi ^a   Higami, Yoshinobu ^a   Kadoyama, Shuhei ^a   Aikyo, Takashi ^a   Takamatsu, Yuzo ^a   Yamazaki, Koji ^b   Tsutsumi, Toshiyuki ^b   Yotsuyanagi, Hiroyuki ^c   Hashizume, Masaki ^c  

^a EHIME UNIVERSITY   (Japan)

^b MEIJI UNIVERSITY   (Japan)

^c Graduate School of Advanced Technology and Science

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATIONS; DSM CIRCUITS; LOGIC VALUES; MANUFACTURING TECHNOLOGIES; OPEN FAULTS; SIMULATION RESULTS;

COMPUTATIONAL METHODS; COMPUTER SIMULATION; NETWORKS (CIRCUITS);

TESTING;

EID: 48049105547     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2007.4387980     Document Type: Conference Paper

References (9)

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