A novel approach for improving the quality of open fault diagnosis

Proceedings: 22nd International Conference on VLSI Design - Held Jointly with 7th International Conference on Embedded Systems

Volumn , Issue , 2009, Pages 85-90

  Yamazaki, Koji ^a   Tsutsumi, Toshiyuki ^a   Takahashi, Hiroshi ^b   Higami, Yoshinobu ^b   Aikyo, Takashi ^b   Takamatsu, Yuzo ^b   Yotsuyanagi, Hiroyuki ^c   Hashizume, Masaki ^c  

^a MEIJI UNIVERSITY   (Japan)

^b EHIME UNIVERSITY   (Japan)

^c UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION COSTS; DEFECT SITES; DIAGNOSIS METHODS; DIAGNOSTIC QUALITIES; FAULT DIAGNOSIS METHODS; FAULTY LINES; INTERCONNECT WIRES; OPEN FAULTS; PROCESS TECHNOLOGIES; THRESHOLD FUNCTIONS;

DEFECTS; INTEGRATED CIRCUITS;

EMBEDDED SYSTEMS;

EID: 62949205731     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI.Design.2009.53     Document Type: Conference Paper

References (13)

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