Interconnect open defect diagnosis with physical information

Proceedings of the Asian Test Symposium

Volumn 2006, Issue , 2006, Pages 203-208

  Zou, Wei ^a   Cheng, Wu Tung ^a   Reddy, Sudhakar M ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CHARGE; ELECTRIC CURRENTS; FAILURE ANALYSIS; LOGIC GATES; THRESHOLD VOLTAGE;

DOWN STREAM GATES; INTERCONNECT OPEN DEFECT DIAGNOSIS; NODES;

INTERCONNECTION NETWORKS;

EID: 33947617816     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2006.261021     Document Type: Conference Paper

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