Electronic structures and optical properties of 6H- and 3C-SiC microstructures and nanostructures from x-ray absorption fine structures, x-ray excited optical luminescence, and theoretical studies

Journal of Physical Chemistry C

Volumn 114, Issue 15, 2010, Pages 6966-6975

  Liu, Lijia ^a   Yiu, Y M ^a   Sham, T K ^a   Zhang, Liying ^b   Zhang, Yafei ^b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b Shanghai Jiao Tong University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; COMPARATIVE STUDIES; CORE SHELL STRUCTURE; CORE-SHELL NANOWIRES; IN-BAND; IN-CORE; PHOTON ENERGY; POLYTYPES; SURFACE STATE; THEORETICAL CALCULATIONS; THEORETICAL STUDY; X RAY ABSORPTION FINE STRUCTURES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY EXCITATION; X-RAY EXCITED OPTICAL LUMINESCENCE; XANES;

ABSORPTION; DENSITY FUNCTIONAL THEORY; ELECTRONIC DENSITY OF STATES; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; HYDROFLUORIC ACID; LIGHT; LUMINESCENCE; MORPHOLOGY; NANOWIRES; OPTICAL PROPERTIES; PHOTONS; SHELLS (STRUCTURES); SILICON; SILICON OXIDES; SURFACE DEFECTS; X RAY ABSORPTION; X RAY ANALYSIS;

SILICON CARBIDE;

EID: 77951113526     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp100277s     Document Type: Article

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