Edge-jump inversion in the Si L3,2-edge optical XAFS of porous silicon

Journal of Synchrotron Radiation

Volumn 6, Issue 3, 1999, Pages 215-216

  Sham, T K ^a   Coulthard, I ^a,b  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Optical XAFS; Porous silicon; Si L3,2 edge

Indexed keywords

EID: 0033437854     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049599001314     Document Type: Article

References (14)

1. Bianconi, A., Jackson, D., & Monahan, K. (1978). Phys. Rev. B 17, 2021-2022.
2. Coulthard, I., Jiang, D.T., Zhu, Y. J. & Sham, T.K. (1999). J. Porous Materials, in press.
3. Coulthard, I. (1998). Ph.D. Thesis, University of Western Ontario.
4. Cullis, A.G, Canham, L.T. & Calcott, P.D.J. (1997). J. Appl. Phys. 82, 909-965.
5. Erbil, A., Cargill III, G.S, Frahm, R. & Boehme, R.F. (1988). Phys. Rev. B 37, 2450-2459.
6. Goulon, J., Tola, P., Lemonnier, M. & Dexpert-Ghys, J. (1983). Chem. Phys. 789, 34-37.
7. Henke, B.L. Lee, P., Tanaka, T.J., Shimabukuro, R.L. & Fujikawa, B.K.(1982) Atomic Data and Nuclear Data Tables 27, 1-144.
8. Jacobs, J., Hamilton, B. & Canham, L.T. (1999) J. Porous Materials, in press.
9. Jiang, D.T., Coulthard, I., Sham, T.K., Lorimer, J.W., Frigo, S.P, Feng, X.H. & Rosenberg, R.A.(1993) J. Appl. Phys. 74, 6335-6340.
10. Kasrai, M., Lennard, W.N, Brunner, R.W., Bancroft, G.M., Bardwell, J.A & Tan, K.H. (1996). Appl. Surf. Sci. 99, 303-312.
11. Murata, T., Harada, H., Emura, S., Nomura, M., Bauchspiess, K. &. Maeda, H. (1993) Jpn. J. Appl. Phys. C20, 213-215.
12. Pettifer, R.F. & Bourdillon, A.J.(1987). J. Phys. C 20, 329-332.
13. Rosenberg, R.A., Simons, J.K, Frigo, S.P., Tan, K.H. & Chen, J.M.(1992) Rev. Sci. Instrum, 63, 2193-2196.
14. XAFS IX Proceedings (1977). J. Phys. IV France 7, C2.