Total reflection X-ray photoelectron spectroscopy: A review

Journal of Electron Spectroscopy and Related Phenomena

Volumn 178-179, Issue C, 2010, Pages 268-272

  Kawai, Jun ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Glancing incidence; Grazing incidence; Total reflection; X ray photoelectron spectroscopy

Indexed keywords

GLANCING INCIDENCE; GRAZING INCIDENCE; HISTORICAL DEVELOPMENT; INELASTIC MEAN FREE PATH; INTERFERENCE EFFECTS; TOTAL REFLECTION;

ELECTROMAGNETIC WAVE REFLECTION; ELECTRONS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77951023168     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.12.001     Document Type: Review

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