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Volumn 88-91, Issue , 1998, Pages 787-791

Surface analysis of Si/W multilayer using total reflection X-ray photoelectron spectroscopy

Author keywords

Grazing incidence X rays; Surface analysis; Total reflection X rays; X ray multilayer optics

Indexed keywords


EID: 0043140202     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00207-7     Document Type: Article
Times cited : (4)

References (29)
  • 1
    • 4243345378 scopus 로고    scopus 로고
    • Total Reflection X-Ray Fluorescence Analysis
    • D.K.G. de Boer, R. Klockenkämper (Eds.), Spectrochim. Acta, 52B(7), Special Issue, Total Reflection X-Ray Fluorescence Analysis (1997).
    • (1997) Spectrochim. Acta , vol.52 B , Issue.7 SPEC. ISSUE
    • De Boer, D.K.G.1    Klockenkämper, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.