Soft X-ray absorption spectroscopy with variable surface sensitivity using fluorescence yield detection

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 2, 1997, Pages

  Kitajima, Y ^a  

^a HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; FLUORESCENCE; LIGHT REFLECTION; SURFACE PROPERTIES;

SOFT X RAY ABSORPTION SPECTROSCOPY; SURFACE SENSITIVITY;

X RAY SPECTROSCOPY;

EID: 0031120053     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1997212     Document Type: Article

References (6)

1. Tröger L., Arvanitis D., Baberschke K., Michaelis H., Grimm U., Zschech E., Phys. Rev. B 46 (1992) 3283-3289.
2. Kitajima Y., Rev. Sci. Instrum. 66 (1995) 1413-1415.
3. Suzuki Y., Phys. Rev. B 39 (1989) 3393-3395.
4. Kitajima Y., J. Elec. Spec. Relat. Phenom. 80 (1996) 405-408.
5. Funabashi M., Ohta T., Yokoyama T., Kitajima Y. and Kuroda H., Rev. Sci. Instrum. 60 (1989) 2505-2508.
6. de Bokx P.K. and Urbach H.P., Adv. X-Ray Chem. Anal. Jpn. 26s (1995) 199-204.