Total reflection X-ray photoelectron spectroscopy of copper phthalocyanine-gold multilayers

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 52, Issue 7, 1997, Pages 873-879

  Kawai, Jun ^a   Amano, Hiroyuki ^a   Hayashi, Kouichi ^a   Horiuchi, Toshihisa ^a   Matsushige, Kazumi ^a   Kitajima, Yoshinori ^b  

^a KYOTO UNIVERSITY   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Surface analysis; Surface layer analysis; X ray photoelectron spectroscopy; X ray total reflection

Indexed keywords

COPPER COMPOUNDS; ELECTROMAGNETIC WAVE REFLECTION; GOLD; ORGANOMETALLICS; SILICON WAFERS; SILVER; X RAY PHOTOELECTRON SPECTROSCOPY;

COPPER PHTHALOCYANINE; SURFACE ANALYSIS; TOTAL REFLECTION X RAY PHOTOELECTRON SPECTROSCOPY;

METALLIC SUPERLATTICES;

EID: 0031165120     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(96)01646-1     Document Type: Article

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