Tunable high-energy X-ray photoemission

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 683-687

  Drube, W ^a   Grehk, T M ^a   Treusch, R ^a,b   Materlik, G ^a  

^a DESY   (Germany)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

High energy PXS; Information depth; Resonance phenomena; Threshold processes

Indexed keywords

EID: 18144440344     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00257-0     Document Type: Article

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