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Volumn 40, Issue 3-4, 2008, Pages 738-740
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High-energy total reflection X-ray photoelectron spectroscopy for polished iron surface
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Author keywords
Background; Iron; Spectroscopy; Synchrotron radiation; Total reflection; XPS
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Indexed keywords
POLISHING;
SYNCHROTRON RADIATION;
X RAY PHOTOELECTRON SPECTROSCOPY;
BACKGROUND;
PENETRATION DEPTH;
IRON;
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EID: 42449160299
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.2728 Document Type: Conference Paper |
Times cited : (4)
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References (11)
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