Surface-Sensitive X-Ray Fluorescence and Diffraction Analysis with Grazing-Exit Geometry

X-Ray Spectrometry

Volumn 28, Issue 6, 1999, Pages 433-439

  Noma, T ^a   Takada, K ^a   Iida, A ^b  

^a CANON INC   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; FLUORESCENCE; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION;

ANALYSIS TECHNIQUES; DIFFRACTION ANALYSIS; DIFFRACTION INTENSITY; GRAZING EXIT; LAYERED THIN FILMS; SAMPLE SURFACE; STRUCTURAL INFORMATION; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS; X- RAY DIFFRACTIONS;

SURFACE ANALYSIS;

EID: 0001267871     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199911/12)28:6<433::AID-XRS386>3.0.CO;2-C     Document Type: Article

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