3D Simulation and analysis of the radiation tolerance of voltage scaled digital circuit

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 2009, Pages 498-504

  Garg, Rajesh ^a   Khatri, Sunil P ^b  

^a INTEL CORPORATION   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3D SIMULATIONS; AVERAGE ERRORS; CHARGE COLLECTION; DYNAMIC SUPPLY VOLTAGE SCALING; HIGH-ENERGY PARTICLES; LOW POWER; NOMINAL VOLTAGE; RADIATION PARTICLES; RADIATION TOLERANCES; RELIABLE SYSTEMS; SINGLE EVENT UPSETS; SPICE MODEL; SPICE-BASED; SUB-THRESHOLD DESIGN; SUBTHRESHOLD; SUBTHRESHOLD CIRCUITS; SUPPLY VOLTAGES; VLSI SYSTEM;

DESIGN; DIGITAL INTEGRATED CIRCUITS; HARDENING; INTEGRATED CIRCUIT MANUFACTURE; PARTICLE SIZE ANALYSIS; RADIATION; RADIATION HARDENING; THREE DIMENSIONAL; THREE DIMENSIONAL COMPUTER GRAPHICS; THRESHOLD ELEMENTS; VOLTAGE STABILIZING CIRCUITS;

SPICE;

EID: 77951021522     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2009.5413111     Document Type: Conference Paper

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