Curved graded multilayers for X-ray nano-focusing optics

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 616, Issue 2-3, 2010, Pages 98-104

  Morawe, Ch ^a   Osterhoff, M ^a,b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Graded multilayers; Synchrotron optics; X ray focusing

Indexed keywords

3RD GENERATION; D-SPACING; DEPOSITION METHODS; DIFFRACTION LIMITS; EXPERIMENTAL DATA; FOCUSING DEVICE; FOCUSING PERFORMANCE; GRADED MULTILAYERS; INITIAL ESTIMATE; KIRKPATRICK-BAEZ; NANO-FOCUSING; NUMERICAL APPROACHES; SYNCHROTRON OPTICS; SYNCHROTRON SOURCE; TOTAL REFLECTION MIRRORS; X-RAY FOCUSING;

FOCUSING; LIGHT; SYNCHROTRONS;

MULTILAYERS;

EID: 77950856285     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.11.064     Document Type: Article

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