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Volumn 49, Issue 1 Part 2, 2010, Pages

Band-bending at the graphene-sic interfaces: Effect of the substrate

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; IN-SITU SYNCHROTRONS; INTERFACE PROPERTY; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPY; PHOTOEMISSION SPECTROSCOPY; SIC SUBSTRATES; SURFACE POLARITIES;

EID: 77950838479     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.01AH05     Document Type: Article
Times cited : (15)

References (25)
  • 24
    • 0002278671 scopus 로고    scopus 로고
    • -3 at 300K GaN, AlN, SiC, BN, SiC, SiGe, ed. M. E. Levinshtein, S. L. Rumyantsev, and M. S. Shur Wiley, New York
    • -3 at 300K [Yu. Goldberg, M. E. Levinshtein, and S. L. Rumyantsev: in Properties of Advanced SemiconductorMaterials GaN, AlN, SiC, BN, SiC, SiGe, ed. M. E. Levinshtein, S. L. Rumyantsev, and M. S. Shur (Wiley, New York, 2001) p. 93].
    • (2001) Properties of Advanced SemiconductorMaterials , pp. 93
    • Goldberg, Y.1    Levinshtein, M.E.2    Rumyantsev, S.L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.