SCOPUS 정보 검색 플랫폼

Volumn 81, Issue 3, 2010, Pages

An experimental procedure for precise evaluation of electron density distribution of a nanostructured material by coherent x-ray diffraction microscopy

(8) Takahashi, Yukio a Kubo, Hideto a Nishino, Yoshinori b Furukawa, Hayato a Tsutsumi, Ryosuke a Yamauchi, Kazuto a Ishikawa, Tetsuya b Matsubara, Eiichiro c

a OSAKA UNIVERSITY (Japan)

b RIKEN SPring 8 Center ^* (Japan)

c KYOTO UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT X-RAY DIFFRACTION; CONTRAST RESOLUTION; ELECTRON DENSITIES; ELECTRON DENSITY DISTRIBUTION; EXPERIMENTAL PROCEDURE; FOCUSED ION BEAM CHEMICAL VAPOR DEPOSITION; NANO-STRUCTURED; PROJECTION IMAGE; SPATIAL RESOLUTION; SURFACE UNITS; X RAY INTENSITY;

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; ELECTRONIC DENSITY OF STATES; NUCLEAR INSTRUMENTATION; X RAY DIFFRACTION;

ELECTRONS;

EID: 77950580034 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3361265 Document Type: Article

Times cited : (1)

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