메뉴 건너뛰기




Volumn 21, Issue 1, 2010, Pages

Towards quantitative determination of the spring constant of a scanning force microscope cantilever with a microelectromechanical nano-force actuator

Author keywords

Calibration; Cantilever; Microelectromechanical nanoforce actuator; Scanning force microscope; Spring constant

Indexed keywords

ACTUATORS; ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; BIOMECHANICS; MICROSCOPES; NANOCANTILEVERS; SCANNING; SPRINGS (COMPONENTS); STIFFNESS;

EID: 77950218737     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/1/015103     Document Type: Article
Times cited : (24)

References (30)
  • 1
    • 4344578571 scopus 로고    scopus 로고
    • Non-contact AFM with a nanoindentation technique for measuring the mechanical properties of thin films
    • Chowdhury S and Laugier M T 2004 Non-contact AFM with a nanoindentation technique for measuring the mechanical properties of thin films Nanotechnology 15 1017-22
    • (2004) Nanotechnology , vol.15 , pp. 1017-1022
    • Chowdhury, S.1    Laugier, M.T.2
  • 2
    • 0030784013 scopus 로고    scopus 로고
    • Relating elastic modulus to indentation response using atomic force microscopy
    • Vanlandingham M R et al 1997 Relating elastic modulus to indentation response using atomic force microscopy J. Mater. Sci. Lett. 16 117-9
    • (1997) J. Mater. Sci. Lett. , vol.16 , pp. 117-119
    • Vanlandingham, M.R.1
  • 3
    • 27944457267 scopus 로고    scopus 로고
    • Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation
    • Clifford C A et al 2005 Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation Appl. Surf. Sci. 252 1915-33
    • (2005) Appl. Surf. Sci. , vol.252 , pp. 1915-1933
    • Clifford, C.A.1
  • 4
    • 33845215361 scopus 로고    scopus 로고
    • Probing nanomechanical properties of nickel coated bacteria by nanoindentation
    • Wang J et al 2004 Probing nanomechanical properties of nickel coated bacteria by nanoindentation Mater. Lett. 61 917-20
    • (2004) Mater. Lett. , vol.61 , pp. 917-920
    • Wang, J.1
  • 5
    • 34547142139 scopus 로고    scopus 로고
    • Atomic force microscopic observation of surface-supported human erythrocytes
    • Ho M S, Kuo F J, Lee Y S and Cheng C M 2007 Atomic force microscopic observation of surface-supported human erythrocytes Appl. Phys. Lett. 91 023901
    • (2007) Appl. Phys. Lett. , vol.91 , pp. 023901
    • Ho, M.S.1    Kuo, F.J.2    Lee, Y.S.3    Cheng, C.M.4
  • 6
    • 0031042739 scopus 로고    scopus 로고
    • Single molecule force spectroscopy on polysaccharides by atomic force microscopy
    • Rief M et al 1997 Single molecule force spectroscopy on polysaccharides by atomic force microscopy Science 275 1295-7
    • (1997) Science , vol.275 , pp. 1295-1297
    • Rief, M.1
  • 7
    • 0031011695 scopus 로고    scopus 로고
    • Reversible unfolding of individual titin immunoglobulin domains by AFM
    • Rief M et al 1997 Reversible unfolding of individual titin immunoglobulin domains by AFM Science 276 1109-12
    • (1997) Science , vol.276 , pp. 1109-1112
    • Rief, M.1
  • 8
    • 23444459499 scopus 로고    scopus 로고
    • The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis
    • Clifford C A et al 2005 The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis Nanotechnology 16 1666-80
    • (2005) Nanotechnology , vol.16 , pp. 1666-1680
    • Clifford, C.A.1
  • 9
    • 0027540056 scopus 로고
    • A non-destructive method for determining the spring constant of cantilevers for scanning force miccroscopy
    • Cleveland J P and Manne S 1993 A non-destructive method for determining the spring constant of cantilevers for scanning force miccroscopy Rev. Sci. Instrum. 64 403-5
    • (1993) Rev. Sci. Instrum. , vol.64 , pp. 403-405
    • Cleveland, J.P.1    Manne, S.2
  • 10
    • 36449002856 scopus 로고
    • Method for the calibration of atomic force microscope cantilevers
    • Sader J E et al 1995 Method for the calibration of atomic force microscope cantilevers Rev. Sci. Instrum. 66 3789-98
    • (1995) Rev. Sci. Instrum. , vol.66 , pp. 3789-3798
    • Sader, J.E.1
  • 11
    • 0032109073 scopus 로고    scopus 로고
    • Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microsope
    • Sader J E 1998 Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microsope J. Appl. Phys. 84 64-76
    • (1998) J. Appl. Phys. , vol.84 , pp. 64-76
    • Sader, J.E.1
  • 12
    • 0001155528 scopus 로고    scopus 로고
    • Calibration of rectangular atomic force microscope cantilevers
    • Sader J E, Chon J W M and Mulvaney P 1999 Calibration of rectangular atomic force microscope cantilevers Rev. Sci. Instrum. 70 3967-9
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 3967-3969
    • Sader, J.E.1    Chon, J.W.M.2    Mulvaney, P.3
  • 13
    • 36449007442 scopus 로고
    • Calibration of atomic-force microscope tips
    • Hutter J L and Bechhoefer J 1993 Calibration of atomic-force microscope tips Rev. Sci. Instrum. 64 1868-73
    • (1993) Rev. Sci. Instrum. , vol.64 , pp. 1868-1873
    • Hutter, J.L.1    Bechhoefer, J.2
  • 14
    • 34347209835 scopus 로고
    • Calculation of thermal noise in atomic force microscopy
    • Butt H J and Jaschke M 1995 Calculation of thermal noise in atomic force microscopy Nanotechnology 6 1-7
    • (1995) Nanotechnology , vol.6 , pp. 1-7
    • Butt, H.J.1    Jaschke, M.2
  • 15
    • 0001026801 scopus 로고    scopus 로고
    • A method for determining the spring constant of cantilevers for atomic force microscopy
    • Torii A et al 1996 A method for determining the spring constant of cantilevers for atomic force microscopy Meas. Sci. Technol. 7 179-84
    • (1996) Meas. Sci. Technol. , vol.7 , pp. 179-184
    • Torii, A.1
  • 16
    • 34548420670 scopus 로고    scopus 로고
    • Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array
    • Gates R S et al 2007 Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array Rev. Sci. Instrum. 78 086101
    • (2007) Rev. Sci. Instrum. , vol.78 , pp. 086101
    • Gates, R.S.1
  • 17
    • 0001314819 scopus 로고    scopus 로고
    • Experimental determination of scanning probe microscope cantilever spring constants utilizing a nanoindentation apparatus
    • Holbery J D, Sarikaya M and Fisher R M 2000 Experimental determination of scanning probe microscope cantilever spring constants utilizing a nanoindentation apparatus Rev. Sci. Instrum. 71 3769
    • (2000) Rev. Sci. Instrum. , vol.71 , pp. 3769
    • Holbery, J.D.1    Sarikaya, M.2    Fisher, R.M.3
  • 18
    • 0041864075 scopus 로고    scopus 로고
    • Accurate force measurement in the atomic force microscope: A microfabricated array of reference springs for easy cantilever calibration
    • Cumpson P J and Hedley J 2003 Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration Nanotechnology 14 918-24
    • (2003) Nanotechnology , vol.14 , pp. 918-924
    • Cumpson, P.J.1    Hedley, J.2
  • 19
    • 0345763129 scopus 로고    scopus 로고
    • Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI
    • Cumpson P J and Hedley J 2003 Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI Nanotechnology 14 1279-88
    • (2003) Nanotechnology , vol.14 , pp. 1279-1288
    • Cumpson, P.J.1    Hedley, J.2
  • 20
    • 3242689013 scopus 로고    scopus 로고
    • Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration
    • Cumpson P J et al 2004 Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration Meas. Sci. Technol. 15 1337-46
    • (2004) Meas. Sci. Technol. , vol.15 , pp. 1337-1346
    • Cumpson, P.J.1
  • 21
    • 0024769661 scopus 로고
    • Laterally driven polysilicon resonant microstructures
    • Tang W C, Nguyen C H and Howe R T 1989 Laterally driven polysilicon resonant microstructures Sensors Actuators A 20 25-32
    • (1989) Sensors Actuators , vol.20 , pp. 25-32
    • Tang, W.C.1    Nguyen, C.H.2    Howe, R.T.3
  • 23
    • 21844436599 scopus 로고    scopus 로고
    • Bonding and deep RIE-a powerful combination of high aspect ratio sensors and actuators
    • Hiller K et al 2005 Bonding and deep RIE-a powerful combination of high aspect ratio sensors and actuators Proc. SPIE 5715 80-91
    • (2005) Proc. SPIE , vol.5715 , pp. 80-91
    • Hiller, K.1
  • 24
    • 33748350915 scopus 로고    scopus 로고
    • Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy
    • Fumagalli L et al 2006 Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy Nanotechnology 17 4581-7
    • (2006) Nanotechnology , vol.17 , pp. 4581-4587
    • Fumagalli, L.1
  • 25
    • 33745098639 scopus 로고    scopus 로고
    • The lateral instability problem in electrostatic comb drive actuators: Modeling and feedback control
    • Borovic B et al 2006 The lateral instability problem in electrostatic comb drive actuators: modeling and feedback control J. Micromech. Microeng. 16 1233-41
    • (2006) J. Micromech. Microeng. , vol.16 , pp. 1233-1241
    • Borovic, B.1
  • 26
    • 77950195750 scopus 로고    scopus 로고
    • Packaging of MEMS structures in SCREAM technology using anodic bonding
    • Frömel J, Wiemer M and Gener T 2005 Packaging of MEMS structures in SCREAM technology using anodic bonding Proc. Micro System Technologies (München, 5-6 October) pp 99-104
    • (2005) Proc. Micro System Technologies , pp. 99-104
    • Frömel, J.1    Wiemer, M.2    Gener, T.3
  • 27
    • 33846051028 scopus 로고    scopus 로고
    • Calibration of micro force setting standards using a new nano force calibration device
    • Doering L, Peiner E, Behrens I and Brand U 2003 Calibration of micro force setting standards using a new nano force calibration device Proc. MST (Micro System Technologies) (München) pp 492-4
    • (2003) Proc. MST (Micro System Technologies) , pp. 492-494
    • Doering, L.1    Peiner, E.2    Behrens, I.3    Brand, U.4
  • 28
    • 77950209545 scopus 로고    scopus 로고
    • Development of a micro-miniature nanoindentation instrument
    • Li Z, Gao S and Herrmann K 2007 Development of a micro-miniature nanoindentation instrument Proc. Conf. on HARDMEKO pp 13-6
    • (2007) Proc. Conf. on HARDMEKO , pp. 13-16
    • Li, Z.1    Gao, S.2    Herrmann, K.3
  • 30
    • 85034781066 scopus 로고    scopus 로고
    • NANOSENSORS Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchatel Switzerland
    • NANOSENSORS Rue Jaquet-Droz 1 Case Postale 216 CH-2002 Neuchatel Switzerland (www.nanosensors.com/products-catalog.html)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.