X-ray and electron microscopy of actinide materials

Micron

Volumn 41, Issue 4, 2010, Pages 336-358

  Moore, Kevin T ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Actinides; Electronic structure; Magnetism; Microscopy; Phase transformation

Indexed keywords

ACTINIDE MATERIALS; ELECTRON BACK-SCATTERED DIFFRACTION; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; MAGNETIC MEMORIES; MICROSCOPY; MICROSCOPY TECHNIQUE; NANO SCALE; PHASE TRANSFORMATION; SCANNING TRANSMISSION X RAY MICROSCOPY; SCANNING TUNNELING MICROSCOPY (STM); SEM; SPIN-POLARIZED; TEM; WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPIES;

ACTINIDES; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; BIOLOGY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; ELECTRONS; MAGNETIC STORAGE; MATERIALS SCIENCE; NANOMAGNETICS; NANOSTRUCTURED MATERIALS; NEUTRON DETECTORS; SCANNING; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY SPECTROSCOPY;

SCANNING ELECTRON MICROSCOPY;

EID: 77949492202     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2009.12.006     Document Type: Review

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