EBSD and FIB/TEM examination of shape memory effect deformation structures in U-14 at.% Nb

Acta Materialia

Volumn 56, Issue 11, 2008, Pages 2638-2648

  Clarke, A J ^a   Field, R D ^a   McCabe, R J ^a   Cady, C M ^a   Hackenberg, R E ^a   Thoma, D J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Deformation structure; Electron backscatter diffraction (EBSD); Shape memory effect (SME); Transmission electron microscopy (TEM); Twinning

Indexed keywords

DEFORMATION; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

DEFORMATION STRUCTURE; ELECTRON BACKSCATTER DIFFRACTION (EBSD);

SHAPE MEMORY EFFECT;

EID: 44649200520     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.02.008     Document Type: Article

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