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Volumn 6, Issue 4, 2000, Pages 324-328
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Microscopy of metal oxide surfaces
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Author keywords
Defects; Electronic structure modelling; Oxides; Scanning electron microscopy; Scanning tunneling microscopy; Surfaces
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Indexed keywords
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EID: 0040185888
PISSN: 14319276
EISSN: None
Source Type: Journal
DOI: 10.1017/S1431927602000569 Document Type: Article |
Times cited : (4)
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References (5)
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