-
2
-
-
0011778578
-
-
and references therein
-
S. S. Hecker, MRS Bull. 26, 672 (2001), and references therein.
-
(2001)
MRS Bull.
, vol.26
, pp. 672
-
-
Hecker, S.S.1
-
16
-
-
0036897418
-
-
Plenum Press, New York
-
EELS spectra were obtained with an energy resolution of ∼1 eV using a Philips CM300 field-emission-gun transmission electron microscope (TEM) equipped with a Gatan imaging filter. The accelerating voltage of the TEM of 300 keV largely exceeds the energy of the actinide 4d → 5f excitation, so that these are governed by electric-dipole transitions; see, e.g., R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1996). EELS was recorded in imaging mode using a collection angle of 6 mrad, allowing the 000 beam and first-order reflections to contribute to the spectra The sample thickness was ∼0.5 inelastic mean free path, as calculated by the zero-loss and plasmon peaks. Samples were 99.9% pure and prepared via either electropolishing or ion milling. While Th and U could be handled directly, all Pu work was performed in a glove box, and samples were transported in a vacuum-transfer holder due to the toxic nature of the metal [for sample preparation procedures, see K. T. Moore, M. A. Wall, and A. J. Schwartz, J. Nucl. Mater. 306, 213 (2002)].
-
(1996)
Electron Energy-Loss Spectroscopy in the Electron Microscope
-
-
Egerton, R.F.1
-
17
-
-
0036897418
-
-
EELS spectra were obtained with an energy resolution of ∼1 eV using a Philips CM300 field-emission-gun transmission electron microscope (TEM) equipped with a Gatan imaging filter. The accelerating voltage of the TEM of 300 keV largely exceeds the energy of the actinide 4d → 5f excitation, so that these are governed by electric-dipole transitions; see, e.g., R. F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum Press, New York, 1996). EELS was recorded in imaging mode using a collection angle of 6 mrad, allowing the 000 beam and first-order reflections to contribute to the spectra The sample thickness was ∼0.5 inelastic mean free path, as calculated by the zero-loss and plasmon peaks. Samples were 99.9% pure and prepared via either electropolishing or ion milling. While Th and U could be handled directly, all Pu work was performed in a glove box, and samples were transported in a vacuum-transfer holder due to the toxic nature of the metal [for sample preparation procedures, see K. T. Moore, M. A. Wall, and A. J. Schwartz, J. Nucl. Mater. 306, 213 (2002)].
-
(2002)
J. Nucl. Mater.
, vol.306
, pp. 213
-
-
Moore, K.T.1
Wall, M.A.2
Schwartz, A.J.3
-
18
-
-
0344011430
-
-
4,5 edge region due to a reduction of the incident beam by x-ray absorption in some part of the beam line optics. This Ni spectral feature was removed prior to the branching ratio determination.
-
(2003)
Phys. Rev. B
, vol.68
, pp. 155109
-
-
Tobin, J.G.1
-
20
-
-
85088488463
-
-
note
-
0 - 2/3).
-
-
-
-
22
-
-
85088492992
-
-
note
-
110〉.
-
-
-
|