Analysis of recrystallized volume fractions in uranium using electron backscatter diffraction

Journal of Microscopy

Volumn 223, Issue 1, 2006, Pages 33-39

  McCabe, Rodney J ^a   Teter, David F ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

EBSD; OIM; Recrystallization; Uranium

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; METALLOGRAPHY; TEXTURES; URANIUM;

EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; MISORIENTATIONS; NEW APPROACHES; OIM; PREPARATION METHOD; RECRYSTALLISATION; SPECIMEN SURFACES; SURFACE FINISHES;

RECRYSTALLIZATION (METALLURGY);

URANIUM;

ANALYTIC METHOD; ARTICLE; CRYSTALLIZATION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS;

EID: 33745920188     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01595.x     Document Type: Article

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