Understanding STM images and EELS spectra of oxides with strongly correlated electrons: A comparison of nickel and uranium oxides

Micron

Volumn 31, Issue 4, 2000, Pages 363-372

  Dudarev, S L ^a   Castell, M R ^a   Botton, G A ^b   Savrasov, S Y ^c   Muggelberg, C ^a   Briggs, G A D ^a   Sutton, A P ^a   Goddard, D T ^d  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b CANMET MATERIALS TECHNOLOGY LABORATORY   (Canada)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^d SELLAFIELD LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034061762     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00115-8     Document Type: Article

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