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Volumn 46, Issue 8, 2010, Pages 1206-1208
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A new system for synthesis of high quality nonpolar GaN thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
GALLIUM NITRATE;
LITHIUM;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL COMPOSITION;
CRYSTAL STRUCTURE;
ELECTRON DIFFRACTION;
FILM;
SYNTHESIS;
THICKNESS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
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EID: 76349096702
PISSN: 13597345
EISSN: None
Source Type: Journal
DOI: 10.1039/b919722b Document Type: Article |
Times cited : (23)
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References (21)
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