Cantilever contribution to the total electrostatic force measured with the atomic force microscope

Measurement Science and Technology

Volumn 21, Issue 2, 2010, Pages

  Guriyanova, Svetlana ^a   Golovko, Dmytro S ^a   Bonaccurso, Elmar ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

Atomic force microscope; Cantilever; Electrostatic interaction

Indexed keywords

ATOMIC FORCE MICROSCOPY; COULOMB INTERACTIONS; ELECTRIC POTENTIAL; ELECTROSTATIC DEVICES; ELECTROSTATIC SEPARATORS; ELECTROSTATICS; MICROSCOPES; NANOCANTILEVERS;

AFM CANTILEVERS; CANTILEVER; LONG RANGE INTERACTIONS; NANO-METER SCALE; PREDICTIVE MODELING; QUANTITATIVE INTERPRETATION; SURFACE FORCE MEASUREMENT; SURFACE IMAGING;

ELECTROSTATIC FORCE;

EID: 75649089675     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/2/025502     Document Type: Article

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