DSP-driven self-tuning of rf circuits for process-induced performance variability

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 18, Issue 2, 2010, Pages 305-314

  Han, Donghoon ^a   Kim, Byung Sung ^b   Chatterjee, Abhijit ^c  

^a TEXAS INSTRUMENTS   (United States)

^b Sungkyunkwan University   (South Korea)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Parametric yield; Process variability; RF circuits; Self tuning

Indexed keywords

ANALOG TO DIGITAL CONVERTERS; BASE BANDS; BUILT-IN DETECTORS; CONTROL VALUES; DIAGNOSTIC TESTS; DSP PROCESSOR; HARDWARE TUNING; MULTIPARAMETERS; OPTIMAL TUNING; PARAMETRIC YIELD; PERFORMANCE VARIABILITY; PROCESS VARIABILITY; PROCESS VARIATION; RF DEVICES; RF PERFORMANCE; RF-CIRCUITS; SELF-TUNING TECHNIQUE; SELFTUNING; SUBMICROMETERS; TEST EQUIPMENTS; TEST RESPONSE;

DIGITAL SIGNAL PROCESSORS; KNOBS; LOW NOISE AMPLIFIERS;

TUNING;

EID: 75549088226     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2009454     Document Type: Article

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