Neurogenetic design centering

IEEE Transactions on Semiconductor Manufacturing

Volumn 19, Issue 2, 2006, Pages 173-181

  Pratap, Rana J ^b   Sen, Padmanava ^a,c,d,e   Davis, Cleon E ^c   Mukhophdhyay, Rajarshi ^a,c   May, Gary S ^a,c,f   Laskar, Joy ^a,c,e,g,h  

^a IEEE   (United States)

^b INTEL CORPORATION   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^d Microwave Applications Group   (United States)

^e Electronic Design

^f National Advisory Board of the National Society of Black Engineers (NSBE)   (United States)

^g Georgia's Electronic Design Center   (Georgia)

^h NSF Packaging Research Center   (United States)

Author keywords

Genetic algorithms (GA); Monte Carlo method; Neural networks; Parametric yield estimation

Indexed keywords

MONTE CARLO METHOD; PARAMETRIC YIELD ESTIMATION; YIELD ENHANCEMENT;

GENETIC ALGORITHMS; MATHEMATICAL MODELS; NEURAL NETWORKS; OPTIMIZATION; VARIABLE FREQUENCY OSCILLATORS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 33646751460     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2006.873517     Document Type: Article

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