Prediction of analog performance parameters using fast transient testing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 3, 2002, Pages 349-361

  Variyam, Pramodchandran N ^a,b   Cherubal, Sasikumar ^a,c   Chatterjee, Abhijit ^a,d  

^a IEEE   (United States)

^b TEXAS INSTRUMENTS   (United States)

^c Ardext Technologies   (United States)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Analog specification prediction; Mixed signal circuit testing; Test generation

Indexed keywords

ANALOG CIRCUITS; MIXED-SIGNAL CIRCUIT TESTING; MULTIVARIATE PARAMETRIC FAULT MODELING; TEST GENERATION;

COMPUTER AIDED NETWORK ANALYSIS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC LOAD FORECASTING; GENETIC ALGORITHMS; OPERATIONAL AMPLIFIERS; PERFORMANCE; TRANSIENTS;

DIGITAL INTEGRATED CIRCUITS;

EID: 0036494662     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.986428     Document Type: Article

References (42)

1. Design of robust test criteria in analog testing
2. Fault diagnosis in analog circuits using element modulation
3. Semiconductor industry technology workshop conclusions
4. Predictive subset testing: Optimizing IC parametric performance testing for quality, cost and yield
5. Tolerance assignment for IC selection tests
6. Cutting the high cost of testing
7. Test-point selection and testability measures via QR factorization of linear models
8. Optimal ordering of analog IC tests to minimize test costs
9. Minimizing productions test time to detect faults in analog circuits
10. VLASIC: A catastrophic fault yield simulator for integrated circuits
11. Detection of catastrophic faults in analog integrated circuits
12. DC-IATP: An iterative analog circuit test generation program for generating DC single pattern tests
13. Analytical fault modeling and static test generation for analog IC's
14. Test generation for analog circuits using partial numerical simulation
15. Analog circuit testing based on sensitivity computation and new circuit modeling
16. Multiple fault-analog circuit testing by sensitivity analysis
17. Fault-based automatic test generator for linear analog devices
18. An integrated approach for analog circuit testing with minimum number of detected parameters
19. Multifrequency analysis of faults in analog circuits
20. LIM-Soft: Automated tool for design and test integration of analog circuits
21. Optimization based multifrequency test generation for analog circuits
22. CLP-based multifrequency test generation for analog circuits
23. Test generation for linear analog circuits
24. Test vector generation for linear analog devices
25. A novel test generation approach for parametric faults in linear analog circuits
26. Analog testing with time response parameters
27. Dynamic test signal design for analog IC's
28. Automated test pattern generation for analog IC's
29. Automatic analog test signal generation using multifrequency analysis
30. Design based analog testing by characteristic observation inference
31. Pseudorandom testing for mixed-signal circuits
32. Test generation for linear time-invariant analog circuits
33. Test generation for comprehensive testing of linear analog circuits using transient response sampling
34. Circuit analysis and optimization driven by worst case distances
35. Hierarchy based statistical fault simulation of mixed-signal IC's
36. Parametric fault diagnosis for analog systems using functional mapping
37. Multivariate adaptive regression splines
38. CRIS: A test cultivation program for sequential VLSI circuits
39. Specification-driven test design for analog circuits
40. Enhancing test effectiveness for analog circuits using synthesized measurements