Parallel loopback test of mixed-signal circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2008, Pages 309-316

  Park, Joonsung ^a   Shin, Hongjoong ^b   Abraham, Jacob A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIXED-SIGNAL CIRCUITS; PARALLEL TESTING;

ANALOG CIRCUITS; BOOLEAN FUNCTIONS; PARAMETER ESTIMATION; SIGNAL PROCESSING;

TESTING;

EID: 51449117231     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2008.53     Document Type: Conference Paper

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