Self-Calibration of Input-Match in RF Front-End Circuitry

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 52, Issue 12, 2005, Pages 821-825

  Das, Tejasvi ^a   Gopalan, Anand ^a   Washburn, Clyde ^a   Mukund, P R ^a  

^a Kate Gleason College of Engineering   (United States)

Author keywords

Built in self test (BiST) for RF circuits; design for fault tolerance; reliability of RF circuits; RF circuit design

Indexed keywords

ALGORITHMS; AMPLIFIERS (ELECTRONIC); BUILT-IN SELF TEST; CALIBRATION; DIGITAL SIGNAL PROCESSING; INTEGRATED CIRCUIT MANUFACTURE;

DESIGN FOR FAULT TOLERANCE; LOW NOISE AMPLIFIER; RF CIRCUITS; SELF-CALIBRATION;

CMOS INTEGRATED CIRCUITS;

EID: 30344431762     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2005.853893     Document Type: Article

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