Test generation for specification test of analog circuits using efficient test response observation methods

Microelectronics Journal

Volumn 36, Issue 9, 2005, Pages 820-832

  Halder, Achintya ^a   Chatterjee, Abhijit ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Analog testing; Analog waveform capture; Automated test generation; Automated test point selection; Parametric failure; Specification testing

Indexed keywords

AUTOMATIC TESTING; CIRCUIT THEORY; RANDOM ACCESS STORAGE; REGRESSION ANALYSIS; SPECIFICATIONS; WAVEFORM ANALYSIS;

ANALOG TESTING; ANALOG WAVEFORM CAPTURE; AUTOMATED TEST GENERATION; AUTOMATED TEST POINT SELECTION; PARAMETRIC FAILURE; SPECIFICATION TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 23844432947     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.03.005     Document Type: Conference Paper

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