A low-cost test solution for wireless phone RFICs

IEEE Communications Magazine

Volumn 41, Issue 9, 2003, Pages 82-89

  Ferrario, John ^a   Wolf, Randy ^a   Moss, Steve ^a   Slamani, Mustapha ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BUILT-IN SELF TEST; COST EFFECTIVENESS; ELECTRIC NETWORK ANALYZERS; ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUIT TESTING; PERSONAL COMPUTERS; TELECOMMUNICATION EQUIPMENT;

AUTOMATIC TEST EQUIPMENT; DIRECT CURRENT PARAMETRIC ANALYZER; WIRELESS PHONE RADIO FREQUENCY INTEGRATED CIRCUITS;

CELLULAR TELEPHONE SYSTEMS;

EID: 0141740464     PISSN: 01636804     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCOM.2003.1232241     Document Type: Article

References (3)

1. M. Slamani et al., "Moving from Mixed-Signal to RF Test Hardware Development," Proc. Int'l. Test Conf. 2001, p. 948.
2. M. Hafed, N. Abaskharoun, and G. Roberts, "A Stand-Alone Integrated Test Core for Time and Frequency Domain Measurements," Proc. Int'l. Test Conf. 2000.
3. S.-G. Lee and R.D. Schultz, "Production DC Screening for RF Performance of a 900-MHz Monolithic Low-Noise Amplifier," IEEE 1995 Microwave and Millimeter-Wave Monolithic Circuits Symp.