The use of Simmons' equation to quantify the insulating barrier parameters in Al/AlOx/Al tunnel junctions

Applied Physics Letters

Volumn 82, Issue 17, 2003, Pages 2832-2834

  Dorneles, L S ^a   Schaefer, D M ^a   Carara, M ^a   Schelp, L F ^a  

^a FEDERAL UNIVERSITY OF SANTA MARIA   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; GLOW DISCHARGES; OXIDATION; SEMICONDUCTOR JUNCTIONS;

MAGNETIC TUNNEL JUNCTIONS (MTJ);

ELECTRON TRANSPORT PROPERTIES;

EID: 0037959840     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569986     Document Type: Article

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