Tip-to-surface distance variations vs voltage in scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 15, 1999, Pages 11045-11050

  Seine, G ^a   Coratger, R ^a   Carladous, A ^a   Ajustron, F ^a   Pechou, R ^a   Beauvillain, J ^a  

^a Lab d'Elaboration Mat d'Etud S   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000213963     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.11045     Document Type: Article

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