Deterministic domain formation observed in ferroelectrics by electrostatic force microscopy

Journal of Applied Physics

Volumn 96, Issue 8, 2004, Pages 4372-4377

  Shin, S ^a   Baek, J ^a   Hong, J W ^a   Khim, Z G ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; COULOMB BLOCKADE; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROSTATICS; EVAPORATION; FREE ENERGY; IMAGE ANALYSIS; POLARIZATION; RELAXATION PROCESSES; SCANNING ELECTRON MICROSCOPY; SULFUR COMPOUNDS; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

COULOMB INTERACTION; CURIE TEMPERATURE; ELECTROSTATIC FORCE MICROSCOPY; TRIGLYCINE SULFATE;

FERROELECTRIC MATERIALS;

EID: 7544222633     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1781760     Document Type: Article

References (49)

1. N. Tanabe et al., , 123.
2. C. H. Ahu, T. Tybell, L. Antognazza, K. Char, R. H. Hammumd, M. R. Beasley, I. Fischer, and J.-M. Triscone, Science 276, 1100 (1997).
3. C. A. Paz de Araujo, J. D. Cuehiaro, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature (London) 374, 627 (1995).
4. J. F. Scott and C. A. Paz de Aranjo, Science 246, 1400 (1989).
5. J. T. Evans and R. Womack, IEEE J. Solid-State Circuits 23, 1171 (1988).
6. N. Nakatani, Jpn. J. Appl. Phys. 12, 313 (1973).
7. B. Hilczer, Cz. Pawlaczyk, L. Szczesniak, K.-P. Meyer, and R. Scholz, Mater. Sci. 7, 427 (1981).
8. G. I. Distler, V. P. Konstantiaova, Y. M. Gerasimov, and G. A. Toimacheva, Nature (London) 218, 762 (1968).
9. R. Le Bihan, Ferroelectrics 97, 19 (1989).
10. N. Tomita, H. Orihara, and Y. Ishibashi, J. Phys. Soc. Jpn. 58, 1190 (1989).
11. F. Tsai and J. M. Cowley, Appl. Phys. Lett. 65, 1906 (1994).
12. J. Kobayashi, K. Uchino, H. Matsuyama, and K. Saito, J. Appl. Phys. 69, 409 (1991).
13. L. L. Pendergrass, J. Appl. Phys. 62, 231 (1987).
14. Z. Li, C. M. Foster, X.-H. Dai, X.-Z. Xu, S.-K. Chan, and D. J. Lam, J. Appl. Phys. 71, 4481 (1992).
15. I. Taguchi, A. Pignolet, L. Wang, M. Proctor, F. Lévy, and P. E. Schmid, J. Appl. Phys. 73, 394 (1993).
16. N. Floquet, J. Hector, and P. Gaucher, J. Appl. Phys. 84, 3815 (1998).
17. M. E. Lines and A. M. Glass, Principles and Applications of Ferroelectrics and Related Materials (Oxford University Press, Oxford, 2001).
18. D. Damjanovic, Phys. Rev. B 55, R649 (1997).
19. Q. Tan, Z. Xu, J. F. Li, and D. Viehland, Appl. Phys. Lett. 71, 1062 (1997).
20. T. Granzow, U. Dörfler, Th. Woike, M. Wöhlecke, R. Pankrath, M. Imlau, and W. Kleemann, Phys. Rev. B 63, 174101 (2001).
21. K. S. Lee, J. H. Choi, J. Y. Lee, and S. Baik, J. Appl. Phys. 90, 4095 (2001).
22. C. V. G. Koukhar, N. A. Pertsev, and R. Waser, Phys. Rev. B 64, 214103 (2001).
23. S. Ganpule, A. L. Roytburd, V. Nagarajan, B. K. Hill, S. B. Ogale, E. D. Williams, R. Ramesh, and J. F. Scott, Phys. Rev. B 65, 014101 (2002).
24. J. W. Hong, K. H. Noh, S.-I. Park, S. I. Kwun, and Z. G. Khim, Phys. Rev. B 58, 5078 (1998).
25. J. W. Hong, D. S. Kahng, J. C. Shin, H. J. Kim, and Z. G. Khim, J. Neurobiol. 16, 2942 (1998).
26. J. W. Hong, S.-I. Park, and Z. G. Khim, Rev. Sci. Instrum. 70, 1735 (1999).
27. R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Appl. Phys. 74, 7461 (1993).
28. H. Bluhm, U. D. Schwarz, K.-P. Meyer, and R. Wiesendanger, Appl. Phys. A: Mater. Sci. Process. 61, 525 (1995).
29. V. Likodimos, X. K. Orlik, L. Pardi, M. Labardi, and M. Allegrini, J. Appl. Phys. 87, 443 (2000).
30. V. Likodiraos, M. Labardi, X. K. Orlik, L. Pardi, and M. Allegrini, Phys. Rev. B 63, 064104 (2001).
31. M. Labardi, V. Likodimos, and M. Allegrini, Phys. Rev. B 61, 14390 (2000).
32. V. Likodimos, M. Labardi, and M. Allegrini, Phys. Rev. B 61, 14440 (2000).
33. X. K. Orlik, V. Likodimos, L. Pardi, M. Labardi, and M. Allegrini, Appl. Phys. Lett. 76, 1321 (2000).
34. V. Likodimos, M. Labardi, and M. Allegrini, Phys. Rev. B 66, 024104 (2002).
35. V. E. Khutorsky and S. B. Lang, J. Appl. Phys. 82, 1288 (1997).
36. S. Balakumar and H. C. Zeng, J. Mater. Chem. 10, 651 (2000).
37. C. Durkan, M. E. Welland, D. P. Chu, and P. Migliorato, Phys. Rev. B 60, 16198 (1999)
38. F. Saurenbach and B. D. Terris, Appl. Phys. Lett. 56, 1703 (1990).
39. O. Kolosov, A. Gruverman, J. Hatano, K. Takahashi, and H. Tokumoto, Phys. Rev. Lett. 74, 4309 (1995).
40. R. Lüthi, H. Haefke, W. Gutmannsbuer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Vac. Sci. Technol. B 12, 2451 (1994).
41. L. M. Eng, M. Friedrich, J. Fousek, and P. Günther, J. Vac. Sci. Technol. B 14, 1191 (1996).
42. H. Bluhm, A. Wadas, R. Wiesendanger, K.-P. Meyer, and L. Szczesniak, Phys. Rev. B 55, 4 (1997).
43. H. Bluhm, U. D. Schwarz, and R. Wiesendanger, Phys. Rev. B 57, 161 (1998).
44. K. Franke, J. Besold, W. Haessler, and C. Seegebarth, Surf. Sci. Lett. 302, L283 (1994).
45. K. Franke, H. Huelz, and M. Weihnacht, Surf. Sci. 416, 178 (1998).
46. A. Gruverman, O. Auciello, and H. Tokumoto, J. Vac. Sci. Technol. B 14, 602 (1996).
47. G. Zavala, J. H. Fendler, and S. Trolier-McKinstry, J. Appl. Phys. 81, 7480 (1997).
48. L. M. Eng, H.-J. Güntherodt, G. Rosenman, A. Skliar, M. Orno, M. Katz, and D. Eger, J. Appl. Phys. 83, 5973 (1998).
49. T. Tybell, C. H. Ahn, and J.-M. Triscone, Appl. Phys. Lett. 75, 856 (1999).