Correlation between structure, microstructure, and ferroelectric properties of PbZr0.2Ti0.8O3 integrated film: Influence of the sol-gel process and the substrate

Journal of Applied Physics

Volumn 84, Issue 7, 1998, Pages 3815-3826

  Floquet, Nicole ^a   Hector, Jérôme ^b   Gaucher, Philippe ^b  

^a CRMC2 CNRS Campus de Luminy   (France)

^b THALES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001523821     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368560     Document Type: Article

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