Atomic structure and electrical properties of In(Te) nanocontacts on CdZnTe(110) by scanning probe microscopy

Advanced Functional Materials

Volumn 20, Issue 2, 2010, Pages 215-223

  Cohen Taguri, Gili ^a   Sinkevich, Ori ^a   Levinshtein, Mario ^a   Ruzin, Arie ^a   Goldfarb, Llan ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; ATOMIC STRUCTURE; BASIC AND APPLIED RESEARCH; CADMIUM ZINC TELLURIDES; COMPLEX CORRELATION; CONTACT FORMATION; CONTACT POTENTIAL DIFFERENCE; CONTROLLED EXPERIMENT; DEVICE PERFORMANCE; ELECTRICAL CONTACTS; ELECTRICAL PROPERTY; HIGH SPATIAL RESOLUTION; IN-SITU; KNOWLEDGE GAPS; METAL-SEMICONDUCTOR CONTACTS; MOLECULAR BEAM EPITAXIAL; NANO SCALE; NANOCONTACTS; NANOMETRICS; RESONANCE TUNNELING; ROOM TEMPERATURE; SCHOTTKY; SEMICONDUCTOR SYSTEMS; SPREADING RESISTANCE; STEP-BY-STEP;

ATOMIC FORCE MICROSCOPY; ATOMS; CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CADMIUM TELLURIDE; ELECTRIC NETWORK ANALYSIS; INDIUM; PROBES; RADIATION DETECTORS; SCANNING; SCANNING TUNNELING MICROSCOPY; WIND TUNNELS; ZINC;

ELECTRIC PROPERTIES;

EID: 74349083157     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200900812     Document Type: Article

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