Characterization of CdTe-In co-sputtered films

Journal of Physics and Chemistry of Solids

Volumn 58, Issue 5, 1997, Pages 807-811

  Ramirez Bon R ^a   Nunez Lopez R ^a   Espinoza Beltran F J ^a   Zelaya Angel, O ^b   Gonzalez Hernandez J ^c  

^a UNIVERSIDAD DE SONORA   (Mexico)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

^c UNIVERSIDAD AUTÓNOMA DE QUERÉTARO   (Mexico)

Author keywords

A. semiconductors; A. thin films; B. X ray diffraction; D. electrical conductivity; D. phase transition

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRIC CONDUCTIVITY OF SOLIDS; FILM GROWTH; PHASE TRANSITIONS; SEMICONDUCTING FILMS; SEMICONDUCTING INDIUM; SEMICONDUCTOR DOPING; SPUTTER DEPOSITION; SUBSTRATES; TERNARY SYSTEMS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

RADIO FREQUENCY SPUTTERING DEPOSITION TECHNIQUE; TERNARY ALLOYS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0031140593     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(96)00179-5     Document Type: Article

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